Educational Scanning Tunneling Microscope (FM-Nano View T-STM)

Product Overview

Product Description: Teaching Scanning Tunneling Microscope FM-NanoviewT-STM Miniaturized and detachable design, easy to carry and classroom teaching; The detector head and sample scanning table are integrated, which is stable and reliable; Single-axis drive sample to

Basic Information

Pedagogical scanning tunneling microscopes

• Miniaturized and detachable design, easy to carry and classroom teaching;
  
• The detector head and sample scanning table are integrated, which is stable and reliable;
  
• Single-axis drive sample to automatically approach the probe vertically, accurately locate the scanning area, and make the needle tip perpendicular to the sample scanning;
  
• The intelligent needle feeding mode of automatic detection of pressurized electric ceramics controlled by the motor protects the probe and sample;
  
• Side CCD observation system, real-time observation of probe needle insertion status and positioning of sample scanning area;
  
• Spring-suspended shockproof method, simple and practical, good shockproof effect;
  
• Integrated scanner hardware nonlinear correction user editor, nanometer characterization and measurement accuracy is better than 98%.
  

Technical Parameters

• Working mode: constant height mode, constant current mode
  
• Sample size: Φ90mm, H20mm
  
• Scanning range: 1000nm in XY, 200nm
  in Z direction
• Scanning resolution: 0.05nm in XY, 0.01nm
  in Z direction
• Sample movement range: 0~13mm
  
• Optical magnification 4X, optical resolution 2.5um
  
• scanning rate 0.6Hz~4.34Hz, scanning angle 0~360°
  
• Scan control: XY adopts 18-bit D/A, Z adopts 16-bit D/A
  
• Data sampling: 14-bit A/D, dual 16-bit A/D multi-channel simultaneous sampling
  
• Feedback mode: DSP digital feedback
  
• Feedback sampling rate: 64.0KHz
  
• Communication interface: USB2.0/3.0
  
• Operating environment: Windows XP/7/8/10 operating system