Cathodoluminescence Imaging and Spectral Detection System

Product Overview

Cathodoluminescence ( CL) is usually configured in a scanning electron microscope or a transmission electron microscope, and can realize the combined study of morphological observation, structural and component analysis with cathodoluminescence spectroscopy, and realize full-spectrum fluorescence scanning imaging. The electron beam spot used for cathodoluminescence excitation is very small and has high energy; compared with photoluminescence (PL), cathodoluminescence has the characteristics of high spatial resolution, high excitation energy, wide spectral range, large excitation depth, and can realize full-spectrum fluorescence scanning imaging. The cathodoluminescence system combined with a scanning electron microscope can realize the combined study of morphological observation, structural and component analysis with cathodoluminescence spectroscopy on semiconductor materials and devices, fluorescent materials (geological and archaeological materials) at a small scale, and has been widely used in semiconductors, microelectronics, materials, physics, geology, archaeology and other fields. In particular, in the research field of the luminescence properties and electronic structure of fluorescent materials such as semiconductor quantum dots and quantum wires at the micrometer and nanometer scales, cathodoluminescence technology has important application value.

Basic Information

Technical capabilities

The research team led by Academician Yu Dapeng has carried out a series of internationally leading research works using this ultra-high spatial resolution cathode-phase fluorescence spectroscopy technology system, mainly including 1) studying the electromechanical coupling properties of semiconductor nano/microwire materials, the influence of strain gradient on luminescence energy, fine electronic structure and exciton transport dynamics mechanism and other very interesting physical effects caused by strain. They are further studying the novel physical phenomenon of Bose-Einstein condensation that may be caused by strain; 2) using this high spatial resolution cathode-phase fluorescence spectroscopy technology system to carry out the dispersion relation, mode distribution law and physical origin of surface plasmons (SPPs) in metal nanocavities.

Key Features

Realize the combined study of morphology observation, structure and composition analysis with negative comparison fluorescence spectroscopy

Achieve full spectrum fluorescence scanning imaging

Realize full spectrum /single spectrum imaging , spectrum collection, and negative comparison of fluorescence spectrum distribution

Application Direction

Cathodoluminescence full spectrum imaging of GaN-based light-emitting devices (left); Cathodoluminescence spectral characteristics of GaN-based light-emitting devices at different excitation energies (right)

CL experimental measurement results of bent ZnO microwires (diameter 1.8μm). a. SEM image of the sample ; b and c , line scan CL measurement results of the unstrained and bent parts ; d . The shift of the edge emission peak changes with the strain in the cross section

Three-dimensional surface plasmon resonance modes in microcavity structures on smooth silver metal surfaces

Cathodoluminescence full-spectrum imaging and spectral analysis of DUV-LED devices

Cathodic fluorescence imaging and spectral analysis of industrial phosphor ( YAG)

Semiconductor laser devices

Semiconductor micro-nano structures and devices

Geological materials