NTI-ArFIB 200 Argon Ion Field Emission Scanning Electron Microscope

Product Overview

As an innovative multi-functional sample preparation and analysis system，the argon ion beam field emission scanning electron microscope NTI-ArFIB 200 has made a breakthrough by integrating a broad-beam argon ion gun into into the scanning electron microscope. It has successfully achieved a seamless connection between ion beam in-situ polishing and high-resolution electron scanning imaging, eliminating sample transfer and greatly enhancing the analysis efficiency. The broad ion beam technology equipped on the NTI-ArFIB 200 has powerrul processing capabilities, enabling it to easily handle large-sized samples at the millimeter level, which significantly broadens its application range. The grazing angle design can effectively reduce the damage to samples during the processing, ensuring the integrity and original state of the samples. The nanometer-level layer cutting module can precisely control the layer removal thickness, and the unique debris trapping device ensures the stable operation of the system, effectively avoiding the interrerence of debris on experiments and potential risks.The NTI-ArFIB 200 is parricularly suitable for samples that are environmentally sensitive or have complex structures, providing users with an efficient and accurate sample characterization solution. The NTI-ArFIB 200 has successfully opened a new chapter in exploring the microscopic world!

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