1. Home
  2. All Product
  3. Product
  4. Products Fabs
  5. Micro-nano Characterization
  6. Scanning electron microscope and related equipment

Scanning electron microscope and related equipment

Filters(0)

We have found 3 items

Sort by

NTI-ArFIB 200 Argon Ion Field Emission Scanning Electron Microscope NTI-ArFIB 200 Argon Ion Field Emission Scanning Electron Microscope

The Dual Beam (DB) system typically refers to a combination of a Scanning Electron Microscope (SEM) + Focused Ion Beam (FIB).

Contact us
Wishlist
NTI-FE 2800 - Field Emission Scanning Electron Microscope NTI-FE 2800 - Field Emission Scanning Electron Microscope

Contact us
Wishlist
NTI-FE 1801- Field Emission Scanning Electron Microscope NTI-FE 1801- Field Emission Scanning Electron Microscope

Contact us
Wishlist
This website uses cookies for best user experience, to find out more you can go to our Privacy Policy and Cookies Policy
Compare product
0/4
Remove all
Compare
Powered By MakeWebEasy Logo MakeWebEasy