NTI-FE 1801- Field Emission Scanning Electron Microscope

Product Overview

The NTI-FE 1801 scanning electron microscope (SEM) uses Schottky field emission gun (FEG) technology. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging performance at low accelerating voltages, enabling high-resolution imaging of various materials. Multiple detector systems efficiently collect diverse electron signals emitted from the sample for imaging, revealing microscopic morphology and structural information of the sample to the maximum extent

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