AFM Electrical Measurements Systems

Product Overview

ResiScope II & Soft ResiScope
The Worlds Greatest Performance for AFM Electrical Characterization
The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution.

The Soft ResiScope mode is able to expand the fields of applications of the « ResiScope II » to soft samples (organic solar cells, conducting polymers or other biological samples).

Basic Information

Resistance measurement

• Current measurement (& IV spectroscopy)
• Resistance 102 ohms to 1012 ohms (10 decades dynamic)
  
• Output information : R, Log R, Current & I/V Spectroscopy

HD-KFM Mode

HD-KFM mode

The most advanced single-pass KFM mode
HD-KFM developed by CSI for the Nano-Observer AFM has the advantage of amplifying the feedback signal through the second eigenmode of the cantilever. Also it allows a much closer probe of the electric field created by the surface potential compared to other approaches.

• Surface potential mapping
• 2nd lock-in amplifier
  
• NO LIFT : Very high sensitivity  & higher spatial resolution
  

Scanning Microwave Impedance Microscopy

Conductivity, Permittivity & N-Doping Concentration

This new AFM mode, developed by PrimeNano, measures the electrical properties of materials at length scales from 10s of nanometers to microns. sMIM modules produce high quality images of local electrical properties with better than 50 nm resolution.

• Unprecedented Sensitivity
  
• Single scan 6 channels of data
  
• Subsurface Imaging
  
• Minimal Sample Prep Time
  
• No Conductive Path Needed
  
• Simultaneously