Park NX-7

Product Overview

Park NX7 is a cost-effective research-grade AFM with adaptable sample handling capabilities. It encompasses Park Systems's cutting-edge technology at a price affordable for various laboratory budgets. Featuring state-of-the-art XY scanning, achieved through independent, closed-loop flexure scanners, the NX7 ensures flat, orthogonal scans with precision height measurements, eliminating the need for additional software processing

Basic Information

Ideal for Smaller Labs or as a Secondary AFM Tool
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.

Key Features

• Unparalleled accuracy and high-resolution imaging with industry-leading low-noise
  
• Comprehensive range of AFM modes for Diverse Applications
  
• Flexible Open-Access, Customizable for Cooperating with Various Research Environments
  

Product Highlights

The Park NX7, equipped with cutting-edge Park Atomic Force Microscopy technology, is designed with the same attention to detail as our newest microscopes. It delivers precise research results with ease. Now at an affordable price, it's the perfect choice for your budget.

• Accurate XY Scanning: Eliminate scanner crosstalk for precise XY scanning
  
• Independent Closed-Loop XY and Z Flexure Scanners: Ensure high-precision data
  
• Orthogonal XY Scanning: Deliver accurate sample topography measurements without software processing
  
• Most Comprehensive AFM Solution: Covers all scanning probe microscopy modes
  
• Smarter NX Electronics Controller: Enables advanced nanomechanical measurement modes by default
  
• Best-in-Class Compatibility and Upgradability: Offers a wide range of options
  
• User-Friendly Software and Hardware: Designed for ease of use
  
• Precise Surface Measurements: Flat sample surface scanning! Low residual bow
  
• No Software Processing Required: Achieve accurate scan results regardless of scan position
  
• NX Electronics Controller Reduces Out-of-Plane Motion to Less Than 2nm
  
• Industry-Leading Low-Noise Z Detector: Less than 0.2 nm noise level for accurate sample topography imaging without edge overshoot and calibration

Key Benefits

Park's core strength lies in its innovative scanner architecture. The unique flexure design, based on independent XY and Z scanners, allows you to effortlessly obtain unparalleled high-precision nanometer-scale resolution data.