Educational Scanning Microscope Probe

Product Description

Product Overview

Product description: Teaching microscope Miniaturized and detachable design, easy to carry and teach;
The laser detector head and sample scanning table are integrated, which is stable and reliable;
Precision laser and probe positioning device, simple and convenient

Basic information

Performance characteristics of teaching microscopes

Miniaturized and detachable design, easy to carry and teach;
The laser detector head and sample scanning table are integrated, which is stable and reliable;
Precision laser and probe positioning device, simple and convenient to replace probe and adjust the light spot;
Single-axis drive sample to automatically approach the probe vertically, accurately locate the scanning area, and make the needle tip perpendicular to the sample scanning;
The intelligent needle feeding mode of automatic detection of pressurized electric ceramics controlled by the motor protects the probe and sample;
4X objective lens optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area;
Spring-suspended shock-proof mode

Technical parameters

Basic working mode: tapping mode, RMS-Z curve measurement
Optional working mode: contact mode, F-Z force curve measurement, friction/lateral force, amplitude/phase, magnetic force and electrostatic force
Sample size: Φ90mm, H20mm
Scanning range: 20um in XY direction, 2um
in Z direction
Scanning resolution: 0.2nm in XY direction, 0.05nm
in Z direction
Sample movement range: 0~13mm
Optical magnification 4X, optical resolution 2.5um
The scanning rate is 0.6Hz~4.34Hz, and the scanning angle is 0~360°
Scan control: XY adopts 18-bit D/A, Z adopts 16-bit D/A
Data sampling: 14-bit A/D, dual 16-bit A/D multi-channel simultaneous sampling
Feedback method: DSP digital feedback
Feedback sampling rate: 64.0KHz
Communication interface: USB2.0/3.0
Operating environment: Windows XP/7/8/10 operating system

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