Park NX-10

Product Overview

The Premiere Choice for Nanotechnology Research

For independent researchers and user facilities alike, the Park NX10 AFM is an affordable, yet versatile platform that provides ease of use with high-resolution capabilities. The instrument is designed to produce images that are inherently distortion-free and reproducible. The Park NX10s easy tip exchange combined with SmartScan softwares one-click imaging and pre-programmed advanced modes make Park AFMs stand out. By combining topographical imaging with the material characterization of electrical, magnetic, thermal, and mechanical properties at the nanoscale, the Park NX10 is the premier choice for cutting-edge materials science research.

Basic Information

Park NX10: Innovation for Innovation
Unmatched Precision, Zero Crosstalk

Industry-leading XYZ linearity: Independent flexure-guided scanners for sample and tip movement.
Minimal out-of-plane drift: Less than 1nm plane drift during full-range horizontal scanning.
Vertical scanner linearity better than 0.015% over its full range. Optimized horizontal scanner ringing: Scientific forward sine-scan algorithm.
Accurate Imaging, True Non-Contact Mode

Industry-leading vertical scanner with over 9kHz bandwidth, enabling tip vertical servo response speeds exceeding 62mm/sec. Fastest scan speeds in non-contact mode. Minimal tip wear for long-term high-quality scanning. Minimal sample damage. Precise Measurements, True Sample Topography

Employs industry-leading low-noise hysteresis detector for sample topography measurement.
Industry-leading minimal forward-reverse measurement deviation, less than 0.15%.
Optimized heat dissipation components significantly reduce system thermal drift and hysteresis. Powerful advanced acoustic enclosure with active temperature control inside the chamber. User Efficiency

Open design for easy tip and sample exchange.
Pre-aligned tip holder and simple, intuitive measurement laser adjustment process with a patented top-down visual system. Innovative "10-second tip approach" function allows for automatic high-speed tip approach. 24-bit digital control box, three sets of built-in lock-in amplifiers, with Q-control and spring constant calibration functions.

Key Features

• Unparalleled Accuracy and High-resolution Imaging with Industry-leading Low-noise
  
• Comprehensive range of AFM modes for Diverse Applications
  
• Flexible Open-Access, Customizable for Cooperating with Various Research Environments
  
• Built for Electrochemical Analysis